The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 08, 2000
Filed:
Dec. 17, 1997
Andrew Krivy, Boise, ID (US);
Micron Technology, Inc., Boise, ID (US);
Abstract
A probe card analyzer includes a table or jig for securing a probe card, a light source for producing at least a first beam of collimated light, and at least a first positioning mechanism for positioning the first beam at a predefined desired probe tip location. A second beam of collimated light and a second positioning mechanism may be provided for positioning the second beam such that it intersects the first beam at the desired probe tip location for visually identifying the desired probe tip location. The first and the second beams may be successively adjusted through a set of desired probe tip location coordinates, the position of each of a set of probe tips being adjusted to the respective desired probe tip location, to which point the probe tip may be adjusted.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile