The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 01, 2000
Filed:
Sep. 30, 1997
Applicant:
Inventor:
Noriaki Shimasaki, Gyoda, JP;
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324765 ; 324 731 ; 3241581 ; 714719 ;
Abstract
In an IC testing device, first and second analog comparators for comparing response waveforms from an I/O pin and an output-dedicated pin of an IC under test and a selector for selecting either one of the outputs from the two analog comparators are provided. By switching the outputs of the analog comparators one from the other with the selector, the conventional I/O common system is used to carry out measurement for the I/O pin of the IC under test and the conventional I/O split system is used to carry out measurement for the input- and output-dedicated pins of the IC.