The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 01, 2000

Filed:

Apr. 21, 1998
Applicant:
Inventors:

Hiroaki Kimura, Osaka, JP;

Junji Kanamoto, Osaka, JP;

Shigeo Tobaru, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
73 1204 ;
Abstract

The present invention allows accurate determination as to if deformation of a vehicle side part has occurred or not as a result of a side impact even though the used data consists of outputs of acceleration sensors for detecting accelerations given as combinations of deformation of a vehicle side part and a travel of the vehicle body. The device comprises a unit for detecting an acceleration produced in a first part of the vehicle body which moves in response to a deformation of the vehicle side part resulting from a side impact; a unit for detecting an acceleration produced in a second part of the vehicle body which substantially does not move in response to a deformation of the vehicle side part resulting from a side impact; a unit for analyzing frequency components included in a time change of the detected acceleration of the first vehicle body part over a prescribed preceding time period; a unit for analyzing frequency components included in a time change of the detected acceleration of the second vehicle body part over a prescribed preceding time period; and a unit for determining deformation of a vehicle side part resulting from a side impact according to the frequency components obtained by the two analyzing units.


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