The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 25, 2000

Filed:

Jun. 24, 1998
Applicant:
Inventor:

Harianto Wong, Singapore, SG;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
438430 ; 438437 ; 438435 ; 438692 ; 438424 ;
Abstract

A method is described for filling trenches in a substrate for shallow trench isolation or for a metal damascene structure which will prevent dishing when the substrate is planarized using chemical mechanical polishing. Trenches are formed in the substrate. A layer of first material is formed on the substrate, sidewalls of the trench, and bottom of the trench. A layer of second material is then formed on the layer of first material. The substrate is then planarized using a chemical mechanical polishing. The first material, second material, and parameters of the chemical mechanical polishing are chosen so that the removal rate of the first material is greater than the removal rate of the second material. The chemical mechanical polishing then results in a planar substrate with no dishing.


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