The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 11, 2000
Filed:
Jan. 09, 1998
Applicant:
Inventors:
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
365201 ; 365201 ; 371 211 ;
Abstract
A test enable control for a built-in self-test of a memory device is provided. In one embodiment of the present invention, a test enabling system is provided. The test enabling system comprises an enable test circuit (62), a plurality of test algorithms stored in a read only memory (72) and a program counter (66) operable to control the execution of the test algorithm. The first instruction of each test is a jump test enable instruction (130) comprising a jump test instruction and an address in the read only memory (72) corresponding to the next test algorithm. The enable test circuit (62) is operable to signal to the program counter (66) if a particular test algorithm is enabled.