The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 04, 2000

Filed:

Oct. 31, 1997
Applicant:
Inventor:

Garry C Gillette, San Jose, CA (US);

Assignee:

Credence Systems Corporation, Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
324763 ; 324765 ;
Abstract

A circuit arrangement for use in a semiconductor integrated circuit tester for measuring leakage current supplied from a pin of a semiconductor integrated circuit device under test (DUT) to a programmed voltage level includes a voltage source having an output terminal, a feedback mechanism connected between the DUT pin and the voltage source for controlling the voltage source to force the DUT pin to the programmed voltage level, a capacitor connected between the output terminal of the voltage source and the DUT pin, and a circuit for measuring voltage developed across the capacitor.


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