The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 28, 1999

Filed:

Mar. 31, 1998
Applicant:
Inventors:

Frank Sauer, Princeton, NJ (US);

Supun Samarasekera, Princeton, NJ (US);

Kwok Tam, Edison, NJ (US);

Assignee:

Siemens Corporate Research, Inc., Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
378 15 ; 378-4 ; 378901 ;
Abstract

A method and apparatus of operating a CT imaging apparatus having a cone beam radiation source and a 2D detector arrangement, for exactly reconstructing an image of a 3D region of interest (ROI) in an object. Measurement data acquired by the 2D detector is processed to develop sub-sets of Radon data. Each of the sub-sets of Radon data is targeted for reconstructing a corresponding local 2D ROI in a 2D parallel projection of the object. Accordingly, after a sub-set of Radon data is completely developed, it is subjected to a first inversion processing step for developing the corresponding local 2D ROI. Multiple ones of the local ROIs are then grouped together and subjected to a second inversion processing step to develop an image reconstruction of a part of the 3D ROI in the object.


Find Patent Forward Citations

Loading…