The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 07, 1999

Filed:

Sep. 30, 1998
Applicant:
Inventors:

Sunil Narayan Shabde, Cupertino, CA (US);

Yowjuang W Liu, San Jose, CA (US);

Donald L Wollesen, Saratoga, CA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
365200 ; 365201 ; 324752 ;
Abstract

Apparatus and methods for determining the robustness of a device to soft errors generated by alpha-particle and/or cosmic ray strikes. In one embodiment, the method includes the steps of producing a light pulse having a light pulse energy, applying the light pulse to the device at a predetermined location, varying the light pulse energy, and detecting soft errors in the device. In another embodiment, the apparatus includes a light source for producing a light pulse that is applied to the device at a predetermined location, a light pulse energy varying circuit coupled to the light source and configured to vary the light energy of the light pulse, and a detecting circuit coupled to the device and configured to detecting soft errors in the device.


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