The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 07, 1999
Filed:
Jun. 23, 1998
Applicant:
Inventor:
Hirohisa Handa, Ibaraki, JP;
Assignee:
Mitutoyo Corporation, Kanagawa, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356359 ; 356357 ; 356345 ;
Abstract
In a machining device, a workpiece is laid on a working mechanism base and a lapping machine laid on the workpiece is operated to rotate. A lap liquid is supplied between the lapping machine and the workpiece. The lapping machine is provided with a plurality of holes as measurement windows. Above the workpiece, an interferometer is disposed on the opposite side of the lapping machine from the workpiece. The interferometer detects interference fringes on a machined surface of the workpiece through the measurement windows. Based on detection results, the rotation of the lapping machine and the position of the workpiece are controlled.