The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 30, 1999
Filed:
Jun. 30, 1997
Applicant:
Inventors:
Shang-Hong Lai, Plainsboro, NJ (US);
Ming Fang, Cranbury, NJ (US);
Assignee:
Siemens Corporate Research, Inc., Princeton, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382131 ; 382156 ; 382169 ;
Abstract
A system for deriving final display parameters for a wide range of MR images consists of a feature generator utilizing both histogram and spatial information computed from an input MR image, a wavelet transform within the feature generator for compressing the size of the feature vector, a competitive layer based neural network for clustering MR images into different subclasses, a bi-modal linear estimation network and a radial bases function network based non-linear estimator for each subclass, as well as a data fusion system using estimates from both estimators to compute the final display parameters.