The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 02, 1999

Filed:

Feb. 11, 1997
Applicant:
Inventor:

Wen-Doe Su, Hsinchu, TW;

Assignee:

Mosel Vitelic, Inc., Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
257509 ; 257506 ;
Abstract

A method of forming field isolation regions (300) on a semiconductor substrate for an integrated circuit. The present method includes forming a sandwich type structure as an oxidation mask (140), (160), and (200). The present sandwich type structure includes an underlying oxide layer (120) formed overlying the top surface. The present sandwich type structure includes a polysilicon layer (140) overlying the oxide layer (120), a first silicon nitride layer (160) overlying the polysilicon layer (140), and a second silicon nitride layer (200) overlying the first silicon nitride layer (160) where the second silicon nitride layer (200) is much thicker than the first layer of silicon nitride (160). The present method also includes patterning the second silicon nitride layer (200), the first silicon nitride layer (160), and the polysilicon layer (140) to define an oxidation mask. The oxidation mask includes exposed regions (210) of the oxide layer (120) where field isolation oxide regions (300) will be formed therein.


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