The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 1999
Filed:
Apr. 22, 1997
Takeshi Fujita, Hatoyama-machi, JP;
Masaharu Kiyama, Higashi-Matsuyama, JP;
Shin-ichiro Umemura, Hachioji, JP;
Takamichi Muramatsu, Tokorozawa, JP;
Yuusuke Miyazaki, Kodama-machi, JP;
Masao Kamahori, Kokubunji, JP;
Noboru Moriya, Tokorozawa, JP;
Shokichi Matsunami, Saitama, JP;
Hitachi, Ltd., Tokyo, JP;
Hitachi Electronics Engineering Co., Ltd., Tokyo, JP;
Abstract
Arranging a pair of temperature control units on both sides of gel 1 and arranging light-transmitting slit 134 on one of the elements, irradiation of an excitation beam over the gel 1 and signal detection are practiced through the slit 134. Introducing dry air onto the slit part, mildew occurrence is prevented on the detecting part. Detecting the power level applied to the gel and calculating the temperature of the temperature control units so that the gel temperature might be a predetermined temperature, on the basis of the detected power level, thereafter carrying out the feedback control of the power level, the gel temperature can be controlled appropriately and strictly during electrophoresis in an automatic fluorescent electrophoresis system, so that high-speed analysis can be done highly reproducibly at a higher voltage applied even by SSCP.