The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 1999

Filed:

Dec. 18, 1997
Applicant:
Inventors:

Bohr-Winn Shih, Meridian, ID (US);

John Stuart Mullin, Sr, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
39550002 ;
Abstract

A method and system for producing property forms for use in creating design schematics for an integrated circuit using computer-aided design apparatus wherein property forms are produced using a unique sophisticated cell library. The library includes a parameter database that includes base level component description format parameters which provide all of the information that is needed for creating the parameter labels, prompts, data boxes, selectors, etc. for property forms for each logic gate defined in a cell library and for a plurality of operating modes. This allows a single cell library to be used in the creation of a design schematic while permitting parameters of all logic gate instances to be specified at any one of three different design levels or modes, including a mode in which only the drive strength of n-channel type devices is specified, a mode in which the drive strengths of N and P type devices are specified, and a mode in which all of the parameters of all devices are specified. The information displayed on the property form can be customized by the user by entering customizing values for one or more of the base level parameters.


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