The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 05, 1999

Filed:

Aug. 20, 1997
Applicant:
Inventors:

Sandra Freedman Feldman, Schenectady, NY (US);

Carl Murray Penney, Saratoga Springs, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356425 ; 356407 ;
Abstract

A probe is configured for measuring color in a sample of material having a refractive index. The probe includes a light source that emits a light beam toward the sample. A color sensor is disposed at an oblique angle with the light source and directed toward a common probe zone for containing the sample. The light source and sensor are optically aligned with a reference plane in the probe zone to effect angles of incidence and reflection relative to the zone having a magnitude substantially equal to Brewster's maximum polarization angle for the refractive index of the sample, for measuring interior color of the sample.


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