The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 14, 1999
Filed:
Jan. 09, 1998
Applicant:
Inventors:
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
365201 ; 36518902 ;
Abstract
A data invert jump instruction test for a built-in self-test of a memory device is provided. The data invert system comprises a read only memory (72) operable to store a plurality of test algorithms wherein at least one of the test algorithms includes a data invert jump instruction (160). Also included is a data invert circuit (178) coupled to the read only memory (72) and a toggle register (188) within the data invert circuit (178). The toggle register (188) is set to one when the data invert jump instruction (160) occurs for the first time in the test algorithm. This causes the data invert circuit (178) to output the inverse of the data inputted through the data invert circuit (178).