The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 14, 1999

Filed:

Feb. 19, 1997
Applicant:
Inventors:

Robert F Sauer, Santa Clara, CA (US);

Kiyoshi Fukushima, Santa Clara, CA (US);

Hiroaki Yamoto, Santa Clara, CA (US);

Assignee:

Advantest Corp., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
714736 ; 395500 ;
Abstract

An emulator software in a semiconductor test system for emulating hardware in the semiconductor test system as well as a semiconductor device to be tested without need to use an actual test system hardware. The emulator software includes an emulator unit which emulates a function of each hardware unit of the test system, a device emulator which emulates a function of a semiconductor device to be tested, a data collecting part for acquiring data from the emulator unit necessary for carrying out a test program, and a device test emulator which generates a test signal to be applied to the device emulator based on the acquired data and compares the resultant signal from the device emulator with the expected data and stores the comparison result therein. In the other aspect, the emulator is combined with the operating system of the semiconductor test system which is capable of easily modifying the software when there is a change or replacement of the hardware of the test system so that the transmission of the control data for the hardware and its operation or the development of the test program can be carried out without using the hardware of the test system.


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