The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 07, 1999

Filed:

Apr. 22, 1998
Applicant:
Inventors:

Howard C Brayman, Pittsford, NY (US);

Mark S Prichard, Rochester, NY (US);

John P Spoonhower, Webster, NY (US);

Nicholas Touchard, Chalon sur Saone, FR;

Thierry Vachette, Esbarres, FR;

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01S / ;
U.S. Cl.
CPC ...
372 24 ; 372 53 ; 372 54 ; 372 15 ; 372 25 ; 372 32 ;
Abstract

A method for exposing light sensitive material to provide exposure patches representing the material sensitivity and which minimizes the effects of intermittency of the light sensitive material, including providing a source of laser light by producing a laser light beam by a continuous wave pump laser which produces a first beam of light and a continuous wave dye laser responsive to the beam of light to produce a second beam of light having gaussian intensity distributions in two orthogonal directions; shaping the second light beam so as to produce a substantially square wave intensity distribution in one direction, while the other direction has a gaussian distribution; and scanning the shaped second light beam through a target of different uniform densities and onto light sensitive material so as to produce a series of exposure patches in one scan of different densities but with the density in each exposure patch being uniform, whereby the effect of intermittency in the light sensitive material is minimized.


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