The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 1999
Filed:
May. 16, 1997
Hideaki Tanaka, Nirasaki, JP;
Yoshihito Marumo, Yamanashi-Ken, JP;
Tokyo Electron Limited, Tokyo, JP;
Abstract
A probe inspection apparatus includes a mounting section mounting an inspection target, a loader section having a convey mechanism for conveying the inspection target on the mounting section, a prober section for inspecting the inspection target conveyed by the convey mechanism, a controller for controlling movements of the prober section and the loader section, and a display unit having a display panel for displaying an operation panel for operating the controller. The operation panel has operation touch keys for operating the controller with an operation content displayed in a user country language, and identification symbol touch keys for displaying an operation content corresponding to the operation keys in a language different from the user country language.