The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 1999

Filed:

Sep. 01, 1995
Applicant:
Inventor:

Luc Van Autryve, St. Cloud, FR;

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
438743 ; 438714 ; 438738 ;
Abstract

A plasma etch process for an insulating layer, such as silicon dioxide, overlaying a silicide layer having a high selectivity with respect to the silicide layer is disclosed, comprising the use of a mixture of a nitrogen-containing gas and one or more other fluorine-containing etch gases in an etch chamber maintained within a pressure range of from about 5 millitorr to about 400 millitorr. The high selectivity exhibited by the etch process of the invention permits operation of the etch process at reduced pressures of from as low as 5 millitorr to about 30 millitorr to achieve complete etching of vertical sidewall openings in the oxide layer with significant overetch capability.


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