The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 03, 1999
Filed:
Jun. 03, 1997
Shih-Jong J Lee, Bellevue, WA (US);
Paul S Wilhelm, Kirkland, WA (US);
Michael G Meyer, Seattle, WA (US);
Wendy R Bannister, Seattle, WA (US);
Chih-Chau L Kuan, Redmond, WA (US);
William E Ortyn, Devall, WA (US);
Larry A Nelson, Bellevue, WA (US);
Keith L Frost, Seattle, WA (US);
Jon W Hayenga, Kent, WA (US);
Neo Path, Inc., Redmond, WA (US);
Abstract
The invention detects areas of interest at low magnification, locating possible abnormal cells or other cells of interest using image processing and statistical pattern recognition techniques. Next, at high magnification, the areas identified at low magnification are re-examined. The information from the low magnification and high magnification scans is collated and a determination is made about the slide--whether it is normal, abnormal, contains endocervical component, and so forth. The invention also provides a method and apparatus to train object feature and slide feature classifiers. The invention provides an automated cytology system that can process training slides for use in a feed back classifier development environment. The invention also can classify endocervical groups of cells.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile