The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 1999

Filed:

Sep. 05, 1997
Applicant:
Inventors:

Lisa Sugiura, Kawasaki, JP;

Mariko Suzuki, Yokohama, JP;

Kazuhiko Itaya, Yokohama, JP;

Hidetoshi Fujimoto, Kawasaki, JP;

Johji Nishio, Kawasaki, JP;

John Rennie, Tokyo, JP;

Hideto Sugawara, Kawasaki, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
257 94 ; 257 96 ; 257 97 ; 257102 ; 257103 ; 372 43 ; 372 44 ; 372 45 ;
Abstract

The present invention provides a nitride system semiconductor device which decreases cost and improves productivity without heat treatment after the growth and which increases in lifetime and reliability by enhancing the quality of a p-type conductive layer, and a method for manufacturing the nitride system semiconductor device. The nitride system semiconductor device has a multilayer structure of an n-type In.sub.x Ga.sub.y Al.sub.z B.sub.1-x-y-z N.sub.m P.sub.n As.sub.1-m-n (0.ltoreq.x, 0.ltoreq.y, 0.ltoreq.z, 0.ltoreq.x+y+z.ltoreq.1, 0<m, 0.ltoreq.n, 0<m+n.ltoreq.1) layer, a p-type In.sub.x Ga.sub.y Al.sub.z B.sub.1-x-y-z N.sub.m P.sub.n As.sub.1-m-n (0.ltoreq.x, 0.ltoreq.y, 0.ltoreq.z, 0.ltoreq.x+y+z.ltoreq.1, 0<m, 0.ltoreq.n, 0<m+n.ltoreq.1) layer, and an electrode 22 formed on a substrate. The oxygen concentration of the surface of the p-type In.sub.x Ga.sub.y Al.sub.z B.sub.1-x-y-z N.sub.m P.sub.n As.sub.1-m-n layer is 5.times.10.sup.18 cm.sup.-3 or lower.


Find Patent Forward Citations

Loading…