The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 03, 1999

Filed:

Jan. 12, 1998
Applicant:
Inventors:

Raj Mohindra, Los Altos, CA (US);

Abhay Bhushan, Palo Alto, CA (US);

Rajiv Bhushan, Mountain View, CA (US);

Suraj Puri, Los Altos, CA (US);

John H Anderson, Sr, Milpitas, CA (US);

Jeffrey Nowell, San Francisco, CA (US);

Assignee:

YieldUP International, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B08B / ; B08B / ;
U.S. Cl.
CPC ...
134 21 ; 134-2 ; 134 254 ; 134 255 ; 134 26 ; 134 37 ; 134902 ; 134 30 ;
Abstract

A method for cleaning a semiconductor wafer. The method includes immersing a wafer in a liquid having water. The wafer has a front face, a back face, and an edge. The method also includes providing a substantially particle free environment adjacent to the front face and the back face as the liquid is being removed. A step of introducing a carrier gas having a cleaning enhancement substance during the providing step also is included. The cleaning enhancement substance dopes the liquid which is attached to the front face and the back face to cause a concentration gradient of the cleaning enhancement substance in the attached liquid to accelerate fluid flow of the attached liquid off of the wafer.


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