The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 27, 1999
Filed:
Jul. 23, 1997
Donato O Forlenza, Hopewell Junction, NY (US);
Franco Motika, Hopewell Junction, NY (US);
John J Shushereba, Essex Junction, VT (US);
Phillip J Nigh, Williston, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A system and method for diagnosing the faults of an electronic device by running a series of tests, identifying the tests where the electronic device failed, without having to check the results of each test, storing information generated during only the tests where the electronic device failed, and using the information to diagnose the faults in the electronic device. The test results are accumulated into a Multiple Input Shift Register (MISR) which need not be examined after each test to determine which tests the device failed. The problem of a failure during one test manifesting into the MISR during subsequent tests is handled by predicting the effect of the failure on the MISR during subsequent tests.