The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 08, 1999
Filed:
Jan. 27, 1997
Takeshi Hashizume, Hyogo-ken, JP;
Kazuhiro Sakashita, Hyogo-ken, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
An integrated circuit device is structured by a plurality of functional modules (2a, 2b) each performing a predetermined function, each functional module including a test circuit (3) for testing the corresponding module. Each test circuit comprises a scan path (3a-3d) for receiving test data from a single common input line to perform a test and outputting a test output, a tri-state buffer (4a) for controlling an output of the test output from the scan path to a single common output line, and a scan path selecting circuit (5a) for selectively driving the tri-state buffer. All the selecting circuits in the integrated circuit device are connected in series to constitute as a whole a shift register. A selecting signal of the serial data is inputted to the shift register, so that the test output of each scan path is selectively supplied to the common output line.