The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 1999
Filed:
Jun. 17, 1997
Kazumichi Yoshiba, Gyoda, JP;
Advantest Corp., Tokyo, JP;
Abstract
A memory test system is to perform two or more comparison operations within one test cycle. The memory test system includes a pattern generator for generating test data patterns to be supplied to the memory device under test, a data selector for providing the test data patterns in a parallel fashion at a plurality of ports, a test data multiplexer for selecting one of the test data patterns at the plurality of ports to supply a plurality of test data patterns to the memory device in a series fashion within each of the predetermined test cycle, an expected value select circuit for selectively providing the test data pattern as expected value data in a parallel fashion, and a logic comparator for receiving, in a parallel fashion, an output signal from the memory device under test generated as a result of the test data patterns and comparing, in parallel, the output signals with the expected value data from the expected value select circuit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile