The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 1999

Filed:

Mar. 24, 1997
Applicant:
Inventors:

Ranko Scepanovic, Cupertino, CA (US);

Cheng-Liang Ding, San Jose, CA (US);

Assignee:

LSI Logic Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364489 ; 364488 ; 364490 ;
Abstract

An apparatus and method for locating a good approximation of optimal Steiner tree routing in the presence of rectilinear obstacles, including finding a Steiner tree on an escape graph. The escape graph is constructed by forming lines from given points (pins) and obstacles. Obstacles and the segments of obstacles are provided with lines parallel to that segment at a given minimum distance S.sub.min from the obstacle is constructed until it reaches either a boundary of an obstacle or a boundary of the core. For pins which do belong to a boundary of an obstacle, a ray, perpendicular to the segment of the boundary on which the pin is located is constructed from the pin and out from the obstacle until it reaches another obstacle or a boundary of the core. For pins which do not belong to an obstacle, vertical and horizontal lines are constructed. A Steiner tree may then be found on the escape graph by using any number of algorithms such as algorithm S and algorithm M. The solution to the problem of finding a Steiner tree for the escape graph also provides a suitable approximation of a Steiner tree for the original problem. This apparatus or method may be used to optimize the routing of conductive paths on integrated circuits.


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