The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 09, 1999

Filed:

Feb. 13, 1996
Applicant:
Inventors:

Akira Suzuki, Hachioji, JP;

Hisao Yabe, Hachioji, JP;

Yoshihiro Iida, Tama, JP;

Hideo Itoh, Hachioji, JP;

Yoshio Tashiro, Hino, JP;

Minoru Yamazaki, Hachioji, JP;

Osamu Tamada, Hachioji, JP;

Keiichi Arai, Hachioji, JP;

Hiroshi Ishii, Hachioji, JP;

Masaaki Nakazawa, Hino, JP;

Koji Yamaya, Hachioji, JP;

Yasuhito Kura, Hachioji, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600176 ; 600121 ; 600132 ; 600154 ; 600156 ;
Abstract

An endoscope system provided with an electronic or optical endoscope is provided therein with an illuminating optical system, an observation optical system, a flow passage system and a forceps channel. Cleaning and disinfection operations are performed on the endoscope so that the endoscope is reusable. An electronic or optical cover type endoscope is provided therein with an illuminating optical system and an observation optical system. The cover type endoscope is used with an endoscope cover having a flow passage system and a forceps channel mounted on the cover type endoscope. The endoscope cover is discarded and replaced whereby the cover type endoscope is reused. Peripheral equipment for endoscope inspection used in combination with the endoscopes is capable of being selectively connected to any of the endoscopes.


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