The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 1999
Filed:
May. 21, 1996
Applicant:
Inventors:
Thomas J Dunaway, New Hope, MN (US);
Deborah A Cullinan, Plymouth, MN (US);
Assignee:
Honeywell Inc., Minneapolis, MN (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
438 17 ; 435 14 ; 435 15 ;
Abstract
Method for testing bare semiconductor die which includes providing a test substrate with a die receiving surface and bond pads with conductive traces which extend away from the surface and are connected to leads that may be contacted with test probes. A vacuum source is applied to an aperture in the die receiving surface. Atmospheric pressure holds the die in place during the connection of thin wires. After connection, the die is held in place during testing by the thin wires.