The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 09, 1999
Filed:
Nov. 06, 1997
Richard G Winkler, Lake Zurich, IL (US);
Kurt E Schmidt, Lindenhurst, IL (US);
David J Groessl, Mundelein, IL (US);
Teradyne, Inc., Boston, MA (US);
Abstract
A line test system for diagnosing and segmenting faults in a switched telephone network. The system includes a remote measurement unit installed at a switch and a test system controller. The test system controller stores data about operating parameters of each of the subscriber lines when they are believed to be free of faults. When a fault is reported, the parameters are measured again. By comparison of the measured parameters with the stored parameters, the fault can be segmented between the premise and the network. Segmentation is performed using knowledge based analysis techniques. The actual source of the fault once it is repaired is also stored by the test system controller. This historical information is used to improve the accuracy of the knowledge based analysis techniques used for segmentation. The line test system is capable of detecting the presence of high impedance ringers. Information on high impedance ringers is used to distinguish between lines that contain open circuit faults and lines that are terminated with high impedance ringers.