The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 02, 1999

Filed:

May. 10, 1995
Applicant:
Inventors:

Tasao Soga, Fujisawa, JP;

Hanae Shimokawa, Kamakura, JP;

Masahide Harada, Yokohama, JP;

Tatsuya Suzuki, Yokohama, JP;

Yuji Ochiai, Oota-ku, JP;

Asao Nakano, Kamakura, JP;

Hiroyoshi Matsumura, Hidaka, JP;

Tsuneaki Kamei, Naka-gun, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05D / ;
U.S. Cl.
CPC ...
702130 ; 364557 ; 340588 ;
Abstract

The present invention relates to an electric appliance and a remaining life estimation system wherein the electric appliance having a printed circuit board on which at least LSI components are mounted includes an IC with sensor. The IC includes a time monitor for calculating the operation status which is a use condition affecting the life of a reusable component of the appliance, a temperature and humidity sensor for detecting at least temperature and humidity environmental conditions affecting the life of the reusable component, and a memory for storing the history of temperature and humidity in correspondence with the history of operation status. A control unit controls storage of the history of temperature and humidity which is detected by the temperature and humidity sensor so as to be stored in the memory in correspondence with the history of operation status which is calculated by the time monitor, and allows, when the remaining life of the component is evaluated so as to decide whether or not to reuse it, external reading of the history of temperature and humidity corresponding to the history of operation status from the memory.


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