The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 02, 1999
Filed:
Jun. 27, 1996
Hiroshi Okuda, Tatebayashi, JP;
Shin Nemoto, Yono, JP;
Hisao Hayama, Gyoda, JP;
Katsumi Kojima, Hasuda, JP;
Advantest Corp., Tokyo, JP;
Abstract
An automatic test handler system for automatically supplying IC devices to be tested to an IC tester and sorting the tested IC devices based on the test results. The system includes a testing machine for testing the IC devices by contacting the IC devices with test contactors. Test signals are provided from the IC tester and the resulting signals from the IC devices are received. The testing machine is installed in a test room in which dust, temperature and humidity are controlled in a high degree. A sorting machine is installed outside of the test room for sorting the IC devices that have been tested based on the test results. The sorting machine has a plurality of sort stations for receiving the IC devices based on categories defined in the test results. Tray cassettes hold a plurality of IC trays containing the IC devices, and both the tray cassettes and IC trays are provided with identification numbers. The trays are horizontally transferred on the testing machine and the sorting machine, and a data communication network connected between the testing machine and the sorting machine transmits the test results and position information of the IC devices in the IC trays.