The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 19, 1999
Filed:
Apr. 14, 1998
Hiroshi Takemoto, Hachiouji, JP;
Eiichi Sekine, Yokohoma, JP;
Advantest Corporation, Tokyo, JP;
Abstract
In a memory testing apparatus wherein a plurality of function tests are continuously carried out for a semiconductor memory and a decision as to whether or not a failure relieving analysis of the memory should be performed is rendered upon completion of each function test, a failure cell counter 15 is provided at the rear stage of a failure analysis memory 13. When a failure memory cell is detected in a memory under test MUT in each function test, the number of failure cells of the memory under test is counted by the failure cell counter. A main controller controls operations of the memory testing apparatus ST such that a failure relieving analysis of the memory under test is performed only when the number of failure memory cells detected in the function test performed this time is greater than the number of failure memory cells detected in the preceding function test.