The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 29, 1998

Filed:

Sep. 09, 1996
Applicant:
Inventors:

Devulapalli V Rao, Lexington, MA (US);

Francisco J Aranda, Arlington, MA (US);

Joby Joseph, New Delhi, IN;

Joseph A Akkara, Holliston, MA (US);

Masato Nakashima, Weston, MA (US);

Assignee:

University of Massachusetts, Boston, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; G03C / ; G11C / ;
U.S. Cl.
CPC ...
359559 ; 359489 ; 430 19 ; 430 21 ; 365121 ;
Abstract

The invention relates to systems and methods for optical Fourier processing and logic operations based on the discovery that the photoinduced anisotropy of photochromic materials such as bacteriorhodopsin, organic fulgides, azo and fluorescent dyes, phycobiliproteins, rhodopsins, and their analogs, is dependent on the intensity of a polarized actinic beam that illuminates the material and the intensity profile of one or more input beams. This intensity dependence can be used to implement a simple, real-time, self-adaptive optical processing, i.e., spatial filtering, system for Fourier processing of optical input images. This optical processing system can be used to process a wide variety of optical input images, from projected still images to live motion picture images.


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