The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 1998

Filed:

Sep. 25, 1997
Applicant:
Inventors:

Toshiaki Kirihata, Poughkeepsie, NY (US);

Hing Wong, Los Altos, CA (US);

Bozidar Krsnik, St. Cloud, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
365200 ; 365201 ; 365210 ; 36518509 ;
Abstract

A method for generating a floating bitline test mode using digitally controllable bitline equalizers is provided. The method utilizes digitally controlled dummy timing cycles to detect a leaky bitline during the floating bitline test mode. A negative pulsed TEST signal is generated to cause the bitline equalizers to go low and cause the floating bitline state. The implementation of dummy timing cycles eliminates the need for additional external control of internal timings during a bitline test mode. Upon the termination of the dummy timing cycle, the normal read operation continues without interruption.


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