The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 24, 1998
Filed:
Sep. 12, 1996
Tim Z Hossain, Austin, TX (US);
John Lowell, Austin, TX (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
Concentration measurement equipment is calibrated by performing a concentration measurement on a reference standard sample which includes a radioactive marker element. Because a count of decay products can be correlated with the number of atoms of the radioactive marker element, a precise count of decay products of the radioactive marker element is used to calculate an otherwise unknown number of atoms of the radioactive marker element on the reference standard sample. The calculated number of atoms of radioactive marker element is then used to calibrate a concentration measurement of the radioactive marker element by the concentration measurement device. Suitable radioactive marker elements for use in calibrating concentration measurement equipment include Pm-147 and Tc-99. Materials, methods and systems in accordance with the teachings of the invention are useful for calibrating concentration measurements and measurement equipment, including Total X-ray Fluorescence (TXRF) and Time Of Flight-Secondary Ion Mass Spectroscopy (TOF-SIMS) measurements and measurement equipment.