The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 1998
Filed:
Jun. 19, 1996
Eric Peeters, Mountain View, CA (US);
Joel A Kubby, Rochester, NY (US);
Fred F Hubble, III, Rochester, NY (US);
Stanley J Wallace, Victor, NY (US);
Alan J Werner, Jr, Rochester, NY (US);
R Enrique Viturro, Rochester, NY (US);
Xerox Corporation, Stamford, CT (US);
Abstract
A sensor system for measuring physical properties of paper. The paper property sensor system includes a surface and a diaphragm opposed to each other. The small diaphragm includes a first pair and a second pair p-type piezoresistors. Each piezoresistor of the first pair has a longitudinal axis and is located perpendicular to and very close to one of the long edges of the diaphragm. Each piezoresistor of the second pair has a longitudinal axis and is located between and parallel to first pair of piezoresistors, and away from the short edges of the diaphragm. Coupling the first pair of piezoresistors with the second pair via a Wheatstone bridge produces a voltage representative of the shear force exerted by a sheet.