The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 1998
Filed:
Nov. 20, 1996
Robert F Sauer, Santa Clara, CA (US);
Jun Makino, Santa Clara, CA (US);
Hiroaki Yamoto, Santa Clara, CA (US);
Advantest Corp., Tokyo, JP;
Abstract
A software structure in a semiconductor test system for easily modifying and transferring data for controlling a hardware when the hardware is changed or replaced. The semiconductor test system includes, an input for providing a test program for specifying various test conditions necessary to test the semiconductor device under test, a master processor for converting the test program to an object code and interpreting the contents of the test program, a processor interface for storing data indicating the hardware characteristics of the semiconductor test system in a table format to assist the interpretation of the test program in the master processor and modifying the table format data in response to the change in the hardware, a library having data tables based on the specification of the semiconductor test system for converting the format of the data compiled and interpreted by the master processor to data of a hardware format, and a driver for transmitting the hardware format data to registers in the hardware of the semiconductor test system through a data bus.