The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 1998

Filed:

Jul. 29, 1996
Applicant:
Inventors:

Edgardo F Klass, Palo Alto, CA (US);

David W Poole, Mountain View, CA (US);

Chaim Amir, Sunnyvale, CA (US);

Raymond A Heald, Los Altos, CA (US);

Assignee:

Sun Microsystems, Inc., Mountain View, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03K / ;
U.S. Cl.
CPC ...
327200 ; 327208 ; 327218 ;
Abstract

A dynamic flip-flop includes a first input latch coupled to receive a data input signal and a second input latch coupled to receive the complement of the data put signal. The first and second input latches have first and second shutoff circuits, respectively. During a precharge phase, the first and second input latches each provide an output signal of a first logic level. During an evaluation phase, the first and second input latches sample the data input signal and complemented data input signal, respectively. In response to the samples of true and the complement of the data input signal, one input latch's output signal will transition to a second logic level, while the other input latch's output signal will remain at the first logic level. A first output latch and a second output latch are coupled to receive the output signals of the first and second input latches, respectively. The first and second output latches are inverting. During the precharge phase, the flip-flop provides output signals of the second logic level from both of the output latches. During the evaluation phase, one output latch will continue to provide an output signal of the second logic level and the other output latch will provide an output signal that transitions from the second logic level to the first logic level.


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