The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 1998

Filed:

Aug. 28, 1995
Applicant:
Inventors:

Akio Arakawa, Kawasaki, JP;

Hideyuki Tsurumaki, Yokohama, JP;

Yoshiaki Hattori, Zama, JP;

Shigeru Kanemoto, Yokohama, JP;

Ichiro Tai, Tokyo-To, JP;

Riyoko Haneda, Yokohama, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382152 ; 382285 ;
Abstract

A method for monitoring equipment state by distribution measurement data comprises: the steps of momentarily taking in two-dimensional distribution measurement data relating to the state of equipments including an equipment to be monitored; allowing the two-dimensional distribution measurement data and a display result by a three-dimensional shape model of the equipment to be monitored to undergo positioning and carrying out overlaid display in such a manner that they are caused to correspond to each other; designating an equipment portion to be inspected from the display content; allowing measurement data of the equipment to be monitored to undergo mapping onto the three-dimensional shape model corresponding to the designated equipment portion; and detecting changes in the measurement data to judge presence or absence of unusual condition of the equipment. Moreover, an equipment state monitoring apparatus comprises: a distribution measurement unit for measuring distribution of temperature, vibration or sound, etc. at the plant equipment surface; a distribution measurement image data positioning unit for determining position and direction of the distribution measurement unit in order to allow distribution measurement image data from the distribution measurement unit to undergo positioning so that it is in correspondence with a projection chart of a corresponding plant equipment spatial shape model; a texture-mapping unit for allowing the distribution measurement image data to undergo texture-mapping onto the surface of the spatial shape model of the plant equipment on the basis of the position and the direction of the measurement unit determined by the distribution measurement image data positioning unit; a projecting unit for describing a projection chart of the texture-mapped plant equipment spatial shape model; and an image display unit for displaying the projection chart from the projecting unit.


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