The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 1998
Filed:
Jan. 31, 1997
John E McGowan, Sunnyvale, CA (US);
Actel Corporation, Sunnyvale, CA (US);
Abstract
A mixed signal integrated circuit architecture comprising a mask programmable portion and a field programmable gate array portion. The mask programmable portion has a plurality of mask programmed analog function circuits, and a first group of input/output pads, wherein one of the input/output pads of the first group is connected to an input of one of the analog function circuits, and one of the input/output pads of the first group is connected to an output of one of the analog function circuits. The field programmable gate array portion has programmable digital logic function modules, a second group of input/output pads, interconnect conductors divided into one or more segments, wherein some segments run in a first direction and some segments run in a second direction to form intersections and some segments form intersections with inputs and outputs of the digital logic function modules, the first group of input/output pads, and inputs and outputs of the analog function circuits from the mask programmable analog portion, and user programmable interconnect elements connected between adjoining ones of the segments in a same one of the interconnect conductors, and between intersections of selected ones the first and second segments, intersections of inputs and outputs of the digital logic function modules and selected interconnect conductors, intersections of the first group of input/output pads and selected ones of the interconnect conductors, intersections with outputs of the analog function circuits and selected ones of the interconnect conductors, and intersections with the inputs of the analog function circuits and selected ones of the interconnect conductors.