The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 08, 1998
Filed:
Jun. 19, 1996
Jacques E Ludman, Hollis, NH (US);
Henri John Caulfield, Hollis, NH (US);
David W Watt, Hollis, NH (US);
Jacques J Ludman, Hollis, NH (US);
Heidi L Callahan, Hollis, NH (US);
Northeast Photosciences, Inc., Hollis, NH (US);
Abstract
An interferometric environmental monitoring system having an active beam and a reference beam, each following an optical path, a detector system including a detector assembly, a pair of reflecting elements, the first reflecting element receiving the active beam and reflecting it, the second reflecting element receiving the reference beam and reflecting it. The reflected active and reflected reference beams are recombined into a recombined beam, which is directed to the detector assembly. The detector assembly monitors the central fringe of an interference pattern formed by interference when combining the active and the reference beams and providing an output signal related to the movement of the central fringe. The output signal being utilized to provide a signal representative of a condition which measurably affects the active beam.