The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 1998
Filed:
Sep. 06, 1996
Juan R Maldonado, Westchester County, NY (US);
Raul E Acosta, Westchester County, NY (US);
Marie Angelopoulos, Westchester County, NY (US);
Fuad E Doany, Westchester County, NY (US);
Chandrasekhar Narayan, Dutchess County, NY (US);
Andrew T Pomerene, Fairfield County, CT (US);
Jane M Shaw, Fairfield County, CT (US);
Kurt R Kimmel, Chittenden County, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Lockheed Martin Corporation, Bethesda, MD (US);
Abstract
An X-ray mask pellicle is capable of protecting the X-ray mask from contaminants and the wafer from contact with the X-ray absorber material of the mask. The X-ray mask pellicle is sufficiently thin to allow X-ray exposure at the required mask to wafer gaps yet is sufficiently durable, replaceable, tough and X-ray resistant to be used in X-ray lithography. A thin (organic or inorganic) X-ray mask pellicle to be placed covering the X-ray mask pattern area is fabricated as a thin film and attached to a support ring. A selected area of the pellicle film, tailored to cover the absorber pattern in the X-ray mask, is etched to decrease its thickness to below 2 .mu.m. If the thin film of the pellicle is not itself conductive, a thin conductive film may be coated on both sides. In an alternative embodiment, the separation between the pellicle and the X-ray mask can be achieved by forming the mask with a stepped profile.