The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 1998

Filed:

Nov. 19, 1996
Applicant:
Inventors:

Daniel J Rader, Albuquerque, NM (US);

Jaime N Castaneda, Albuquerque, NM (US);

Thomas W Grasser, Albuquerque, NM (US);

John E Brockmann, Albuquerque, NM (US);

Assignee:

Sandia Corporation, Albuquerque, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01P / ; G01N / ;
U.S. Cl.
CPC ...
356 28 ; 356336 ; 356338 ; 356342 ;
Abstract

An apparatus for determining particle properties from detected light scattered by the particles. The apparatus uses a light beam with novel intensity characteristics to discriminate between particles that pass through the beam and those that pass through an edge of the beam. The apparatus can also discriminate between light scattered by one particle and light scattered by multiple particles. The particle's size can be determined from the intensity of the light scattered. The particle's velocity can be determined from the elapsed time between various intensities of the light scattered.


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