The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 1998

Filed:

Sep. 21, 1995
Applicant:
Inventors:

David Wooten, Rockville, MD (US);

Bruce Krein, Olney, MD (US);

Jianou Shi, State College, PA (US);

Assignee:

Fusion Systems Corporation, Rockville, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K / ; G01K / ;
U.S. Cl.
CPC ...
374208 ; 374163 ;
Abstract

A combination contact temperature probe/wafer support includes a thermocouple enclosing probe head of low thermal mass and large contact area supported by a support means such that 1) there is a high thermal resistivity connection between the support means and the probe head, and 2) the probe head is self orienting under the weight of the wafer so that the contact area is maintained coplanar with the surface of the wafer.

Published as:
DE19638117A1; JPH09126903A; US5791782A;

Find Patent Forward Citations

Loading…