The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 11, 1998

Filed:

Jul. 26, 1996
Applicant:
Inventor:

James R Meyer, Baton Rouge, LA (US);

Assignee:

MEMC Electronic Materials, Inc., St. Peters, MO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B07B / ;
U.S. Cl.
CPC ...
209245 ; 209248 ; 209682 ; 209683 ;
Abstract

Apparatus for classifying high purity polysilicon particles includes a receptacle for holding the particles and a rotary member for feeding the particles from the receptacle. The rotary member defines at least a portion of a front wall of the receptacle and is supported for rotation about its generally horizontally oriented longitudinal axis. A motor drives rotation of the rotary member such that a longitudinal groove passes through the receptacle to pick up particles smaller than a predetermined size and dump the captured particles onto an inclined surface disposed generally forward of the receptacle. The particles slide downwardly acquiring a velocity according to their shape. A gap between a lower edge of the inclined surface and a first receiver is sized such that only particles having more than a predetermined velocity are capable of traversing the gap to the first receiver. The remaining particles fall through the gap and into a second receiver. The receptacle, inclined surface member and first receiver are constructed with contamination inhibiting material to inhibit contamination of the particles.


Find Patent Forward Citations

Meyer, James. (1998). Polysilicon particle classifying apparatus (U.S. Patent No. 5791493). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5791493

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…