The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 1998
Filed:
Sep. 20, 1996
Applicant:
Inventor:
Yoshinori Iketaki, Ohme, JP;
Assignees:
Research Development Corp., Kawaguchi, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K / ;
U.S. Cl.
CPC ...
378 43 ; 378210 ;
Abstract
X-ray microscopy is used to observe a specimen by labelling the specimen with a molecule having a double bond, such as, for example, N-succinimidyl-4-nitrophenyl acetate or 5-(dimethylamino phenyl)-2,4-pentadienal, which bond to an amino group, and O-(4-nitrobenzyl)-N,N-diisopropyl isourea, which chemically bonds to a carbonyl group. Such labelling groups can generate fluorescence to facilitate the observation of the specimen. Observation is improved by using a monochromatic X-ray source having a photon energy lower than 2000 eV and a band width narrower than 1 eV.