The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 1998
Filed:
Nov. 15, 1996
Shinichi Takeuchi, Tokyo, JP;
Ryo Ishiyama, Tokyo, JP;
Yutaka Kashiwase, Tokyo, JP;
Kinuko Kato, Tokyo, JP;
Ryohei Motegi, Tokyo, JP;
Tokimec Inc., Tokyo, JP;
Abstract
An apparatus for detecting flaws using supersonic waves measures a thickness of a test object or a position of a cavity inside the test object by employing a pair of ultrasonic probes. By, changing a relative position of one ultrasonic probe to that of the other ultrasonic probe, a plurality of waveform data of ultrasonic reception signals is acquired. Each of the acquired waveform data is added together. Because a surface wave component of each waveform data has a shifted phase due to a difference in arrival times, a level of the surface wave component is offset and thus minimized through addition of the waveform data.