The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 1998

Filed:

Nov. 20, 1997
Applicant:
Inventor:

Hisashi Kikuchi, Esashi, JP;

Assignee:

Tokyo Electron, Ltd., Tokyo-to, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D / ;
U.S. Cl.
CPC ...
25023113 ; 25023118 ;
Abstract

An apparatus for detecting objects to be transferred includes a wafer detecting unit having photo-sensors which scan a carrier moved up and down on a lift stage to detect wafers held on respective stages in the carrier, and an indication device provided vertically downward on the lift stage and including light-passing portions and non-light passing portions vertically arranged. The indication device traverses optical axes of a reading unit with, e.g., photo-emitting/detecting device to thereby obtain information of vertical position of a carrier, and, based on combinations of photo-detection signals from the wafer detecting units, absence and presence of wafers on the respective stages are recognized. This arrangement makes it possible that absence and presence of semiconductor wafers on the respective stages in a carrier are quickly and accurately detected, and even when the lift stage is stopped during detection, halting the detection, the detection is resumed at the halted position without returning the carrier to its initial position.


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