The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 30, 1998
Filed:
Mar. 14, 1996
Sridhar Narayanan, Sunnyvale, CA (US);
Marc E Levitt, Sunnyvale, CA (US);
Sun Microsystems, Inc., Palo Alto, CA (US);
Abstract
High speed scan testing is facilitated by pipelining or distributing a scan enable signal to scan circuits through a distribution network. The pipeline is formed from a plurality of scan enable distribution circuits residing on an integrated circuit to be scan tested. Preferably, before reaching the scan circuits, the scan enable signal passes through an equal number of the scan enable distribution circuits. The distribution network of the scan enable distribution circuits take a multitude of forms. The invention allows at-speed toggling of a scan enable signal as well as shifting of test data at functional system frequencies, while maintaining compatibility with test modes such as IEEE Standard 1149.1. The invention is also capable of supporting skewed-load and broad-side delay test modes.