The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 23, 1998

Filed:

Sep. 09, 1996
Applicant:
Inventors:

Ming-Yeon Hung, Hsin-Chu, TW;

Janet Yu, Chang-hua, TW;

Weng-Liang Fang, Hsin-Chu, TW;

Chang-Ching Kin, Hsin-chu Hsien, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C25F / ;
U.S. Cl.
CPC ...
438725 ; 438714 ; 438906 ; 438963 ; 134-12 ;
Abstract

A method is provided for the removal of the surface layer of the residual photoresist mask pattern used for metal subtractive etching which uses the same reactor equipment but employs reactive fluorine-containing gases to form volatile compounds with the surface layer, so that subsequently a conventional oxygen plasma stripping process can be used for complete resist residue removal without requiring excessive temperature exposure of the integrated circuit devices.


Find Patent Forward Citations

Quick Actions:

Hung, Ming-Yeon. (1998). Method for removal of photoresist residue after dry metal etch (U.S. Patent No. 5770523). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5770523

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…